Comparison between Equivalent-circuit and Black-box non-linear models for microwave electron devices

被引:0
|
作者
Raffo, A. [1 ]
Lonac, J. A. [1 ]
Menghi, S. [1 ]
Cignani, R. [1 ]
机构
[1] Univ Ferrara, Dept Engn, I-44100 Ferrara, Italy
来源
GAAS 2005: 13th European Gallium Arsenide and Other Compound Semiconductors Application Symposium, Conference Proceedings | 2005年
关键词
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Black-box and Equivalent-circuit electron device models present different advantages. The first ones are independent from process and device technology (Le, GaAs, InP, GaN). In the other side the black-box model extraction procedure could not be changed and modified, thus a 11 post-tune" procedure is not possible. On the contrary, equivalent circuits are strongly technology dependent, though they are more flexible in the identification procedure. In fact an "optimization" of the extracted model parameters is possible following a trade-off with measured data over a large set of bias conditions and frequencies. In this paper two device models, which represent the two categories, will be compared pointing out the differences in the extraction procedures and in the achievable accuracy under small-signal and large-signal operating conditions.
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收藏
页码:401 / 404
页数:4
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