A versatile high speed bit error rate testing scheme

被引：0
作者：
Fan, YQ [1 ]
Zilic, Z [1 ]
Chiang, MW [1 ]
机构：
[1] McGill Univ, Microelect & Comp Syst Lab, Montreal, PQ H3A 2T5, Canada
来源：
ISQED 2004: 5TH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN, PROCEEDINGS | 2004年
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
The quality of a digital communication interface can be characterized by its bit error rate (BER) performance. To ensure the quality of the manufactured interface, it is critical to quickly and precisely test its BER behavior. Traditionally, BER is evaluated using software simulations, which are very time-consuming. Though there are some standalone BER test products, they are expensive and none of them includes channel emulators, which are essential to testing BER under the presence of noise. To overcome these problems, we present a versatile scheme for BER testing in FPGAs. This scheme consists of two intellectual property (IP) cores: the BER tester (BERT) core and the additive white Gaussian noise (AWGN) generator core. We demonstrate through case studies that the proposed solution exhibits advantages in speed and cost over existing solutions.
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收藏
页码：395 / 400
页数：6
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