Inducing Nanoscale Morphology Changes of Pentaerythritol Tetranitrate Using a Heated Atomic Force Microscope Cantilever

被引:2
|
作者
Nafday, Omkar A. [1 ]
Weeks, Brandon L. [1 ]
King, William P. [2 ]
Lee, Jungchul [2 ]
机构
[1] Texas Tech Univ, Dept Chem Engn, Lubbock, TX 79409 USA
[2] Univ Illinois, Dept Mech Engn, Champaign, IL 61820 USA
关键词
atomic force microscope; pentaerythritol tetranitrate; temperature; thermal cantilever; THERMAL-DECOMPOSITION; PETN; CRYSTALS; DESIGN; SIZE; RDX;
D O I
10.1080/07370650802328830
中图分类号
O69 [应用化学];
学科分类号
081704 ;
摘要
Controlling the morphology of pentaerythritol tetranitrate (PETN) is an important aspect in the nanodetonics research area. Detonation properties are highly dependent on surface area and morphology of PETN. For the first time we show that changes in morphology can be modified at the nanoscale by using a heated atomic force microscope (AFM) cantilever. At temperatures of65C, faceting of PETN islands is observed, whereas at higher temperatures (124C) the height of the islands decrease by an order of magnitude.
引用
收藏
页码:1 / 16
页数:16
相关论文
共 50 条
  • [21] Robust Hybrid Control of an Atomic Force Microscope for the Characterization of Interaction Force Regions at the Nanoscale
    Cailliez, Jonathan
    Boudaoud, Mokrane
    Liang, Shuai
    Regnier, Stephane
    IEEE TRANSACTIONS ON CONTROL SYSTEMS TECHNOLOGY, 2021, 29 (04) : 1689 - 1703
  • [22] Wet-chemical nanoscale patterning of GaAs surfaces using atomic force microscope lithography
    Klehn, B
    Skaberna, S
    Kunze, U
    SUPERLATTICES AND MICROSTRUCTURES, 1999, 25 (1-2) : 473 - 476
  • [23] Application of Instantaneous Cantilever Frequency Fluctuation in Atomic Force Microscope Control Loop
    Hsu, Z-C
    Chang, Peter, I
    2018 18TH INTERNATIONAL CONFERENCE ON CONTROL, AUTOMATION AND SYSTEMS (ICCAS), 2018, : 700 - 705
  • [24] SiO2 and Si nanoscale patterning with an atomic force microscope
    Klehn, B
    Kunze, U
    SUPERLATTICES AND MICROSTRUCTURES, 1998, 23 (02) : 441 - 444
  • [25] Bending of a rectangular cantilever of an atomic force microscope as a function of position along length
    Miyatani, T
    Fujihira, M
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1997, 36 (08): : 5280 - 5281
  • [26] Fabrication of Nanoscale Active Plasmonic Elements Using Atomic Force Microscope Tip-Based Nanomachining
    Barron, Ciaran
    O'Toole, Silas
    Zerulla, Dominic
    NANOMANUFACTURING AND METROLOGY, 2022, 5 (01) : 50 - 59
  • [27] Flexural Vibration of an Atomic Force Microscope Cantilever Based on Modified Couple Stress Theory
    Liang, Li-Na
    Ke, Liao-Liang
    Wang, Yue-Sheng
    Yang, Jie
    Kitipornchai, Sritawat
    INTERNATIONAL JOURNAL OF STRUCTURAL STABILITY AND DYNAMICS, 2015, 15 (07)
  • [28] Micro-fabrication of silicon/ceramic hybrid cantilever for atomic force microscope and sensor applications
    Wakayama, T
    Kobayashi, T
    Iwata, N
    Tanifuji, N
    Matsuda, Y
    Yamada, S
    SENSORS AND ACTUATORS A-PHYSICAL, 2006, 126 (01) : 159 - 164
  • [29] A fresh study for dynamic behaviour of atomic force microscope cantilever by considering different immersion environments
    Gholizadeh Pasha, Ali Hossein
    Sadeghi, Ali
    JOURNAL OF EXPERIMENTAL NANOSCIENCE, 2020, 15 (01) : 129 - 149
  • [30] Force Spectroscopy of Single Protein Molecules Using an Atomic Force Microscope
    Scholl, Zackary N.
    Li, Qing
    Josephs, Eric
    Apostolidou, Dimitra
    Marszalek, Piotr E.
    JOVE-JOURNAL OF VISUALIZED EXPERIMENTS, 2019, (144):