Inducing Nanoscale Morphology Changes of Pentaerythritol Tetranitrate Using a Heated Atomic Force Microscope Cantilever

被引:2
|
作者
Nafday, Omkar A. [1 ]
Weeks, Brandon L. [1 ]
King, William P. [2 ]
Lee, Jungchul [2 ]
机构
[1] Texas Tech Univ, Dept Chem Engn, Lubbock, TX 79409 USA
[2] Univ Illinois, Dept Mech Engn, Champaign, IL 61820 USA
关键词
atomic force microscope; pentaerythritol tetranitrate; temperature; thermal cantilever; THERMAL-DECOMPOSITION; PETN; CRYSTALS; DESIGN; SIZE; RDX;
D O I
10.1080/07370650802328830
中图分类号
O69 [应用化学];
学科分类号
081704 ;
摘要
Controlling the morphology of pentaerythritol tetranitrate (PETN) is an important aspect in the nanodetonics research area. Detonation properties are highly dependent on surface area and morphology of PETN. For the first time we show that changes in morphology can be modified at the nanoscale by using a heated atomic force microscope (AFM) cantilever. At temperatures of65C, faceting of PETN islands is observed, whereas at higher temperatures (124C) the height of the islands decrease by an order of magnitude.
引用
收藏
页码:1 / 16
页数:16
相关论文
共 50 条
  • [1] Nanoscale thermal lithography by local polymer decomposition using a heated atomic force microscope cantilever tip
    Hua, Yueming
    Saxena, Shubham
    Clifford, Henderson
    King, William P.
    JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS, 2007, 6 (02):
  • [2] Lorentz force actuation of a heated atomic force microscope cantilever
    Lee, Byeonghee
    Prater, Craig B.
    King, Andwilliam P.
    NANOTECHNOLOGY, 2012, 23 (05)
  • [3] Nanotopographical imaging using a heated atomic force microscope cantilever probe
    Kim, K. J.
    Park, K.
    Lee, J.
    Zhang, Z. M.
    King, W. P.
    SENSORS AND ACTUATORS A-PHYSICAL, 2007, 136 (01) : 95 - 103
  • [4] Thermal writing and nanoimaging with a heated atomic force microscope cantilever
    King, WP
    Goodson, KE
    JOURNAL OF HEAT TRANSFER-TRANSACTIONS OF THE ASME, 2002, 124 (04): : 597 - 597
  • [5] On the nanoscale measurement of friction using atomic-force microscope cantilever torsional resonances
    Reinstädtler, M
    Rabe, U
    Scherer, V
    Hartmann, U
    Goldade, A
    Bhushan, B
    Arnold, W
    APPLIED PHYSICS LETTERS, 2003, 82 (16) : 2604 - 2606
  • [6] Topography imaging with a heated atomic force microscope cantilever in tapping mode
    Park, Keunhan
    Lee, Jungchul
    Zhang, Zhuomin M.
    King, William P.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2007, 78 (04):
  • [7] Lateral force microscope calibration using a modified atomic force microscope cantilever
    Reitsma, M. G.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2007, 78 (10):
  • [8] Heated atomic force microscope cantilever with high resistivity for improved temperature sensitivity
    Liu, Joseph O.
    Somnath, Suhas
    King, William P.
    SENSORS AND ACTUATORS A-PHYSICAL, 2013, 201 : 141 - 147
  • [9] Ultrananocrystalline diamond tip integrated onto a heated atomic force microscope cantilever
    Kim, Hoe Joon
    Moldovan, Nicolaie
    Felts, Jonathan R.
    Somnath, Suhas
    Dai, Zhenting
    Jacobs, Tevis D. B.
    Carpick, Robert W.
    Carlisle, John A.
    King, William P.
    NANOTECHNOLOGY, 2012, 23 (49)
  • [10] Effect of Zn Doping on the Sublimation Rate of Pentaerythritol Tetranitrate Using Atomic Force Microscopy
    Mridha, Subrata
    Weeks, Brandon L.
    SCANNING, 2009, 31 (05) : 181 - 187