Vibration fatigue reliability of BGA-IC package with Pb-free solder and Pb-Sn solder

被引:48
作者
Kim, Y
Noguchi, H
Amagai, M
机构
[1] Kyushu Univ, Fac Engn, Higashi Ku, Fukuoka 8128581, Japan
[2] Texas Instruments Japan, Ctr Technol, Modeling & Characterizat Branch Tsukuba, Tsukuba, Ibaraki 3050841, Japan
关键词
D O I
10.1016/j.microrel.2005.02.003
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, a new method is proposed for evaluating the high-cycle fatigue strength of BGA (Ball Grid Array) packages with Pb-free solder and Pb-Sn solder due to vibration. An attached weight induced mixed mode stress in the solder ball of a package was used. To consider the effect of the mixed mode stress that occurred in a solder ball and the frequency to fatigue strength of the solder ball, a test was carried out with the three kinds of weights (sigma(n)/tau(n) = 4,5, and 6) at various frequencies (10-27 Hz). To clarify the effect of frequency, a nonlinear analysis with a visco-plastic model was carried out within the range of 0.001-3450 Hz. From the continuous observation of the cross-section of the package and finite element method (FEM) analysis results, it was revealed that the maximum principal stress is the driving force to package failure. Although an intermetallic compound in both packages and a Pb-rich region in a Pb-Sn solder based package were confirmed by EDX microprobe analysis, they do not contribute to the initiation of a crack in a solder ball. The fatigue strength of the Pb-free solder and Pb solder was evaluated on the basis of the maximum principal stress calculated by FEM and the experimental results. (c) 2005 Elsevier Ltd. All rights reserved.
引用
收藏
页码:459 / 466
页数:8
相关论文
共 8 条
[1]   Mechanical characterization of Sn-Ag-based lead-free solders [J].
Amagai, M ;
Watanabe, M ;
Omiya, M ;
Kishimoto, K ;
Shibuya, T .
MICROELECTRONICS RELIABILITY, 2002, 42 (06) :951-966
[2]   Mechanics of Pb40/Sn60 near-eutectic solder alloys subjected to vibrations [J].
Basaran, C ;
Chandaroy, R .
APPLIED MATHEMATICAL MODELLING, 1998, 22 (08) :601-627
[3]  
*DEP DEF, MILSTD883E
[4]  
LIGUORE S, 1995, P A REL MAI, P18, DOI 10.1109/RAMS.1995.513218
[5]   Effect of intermetallic compounds on vibration fatigue of μBGA solder joint [J].
Tu, PL ;
Chan, YC ;
Lai, JKL .
IEEE TRANSACTIONS ON ADVANCED PACKAGING, 2001, 24 (02) :197-205
[6]  
WONG TE, 1996, EL COMP TECHN C, P149
[7]   Vibration reliability characterization of PBGA assemblies [J].
Yang, QJ ;
Pang, HLJ ;
Wang, ZP ;
Lim, GH ;
Yap, FF ;
Lin, RM .
MICROELECTRONICS RELIABILITY, 2000, 40 (07) :1097-1107
[8]   Thermomechanical behavior of micron scale solder joints under dynamic loads [J].
Zhao, Y ;
Basaran, C ;
Cartwright, A ;
Dishongh, T .
MECHANICS OF MATERIALS, 2000, 32 (03) :161-173