Phosphors for LED-based light sources: Thermal properties and reliability issues

被引：53

作者：

Dal Lago, M. ^{[1
]}

Meneghini, M. ^{[1
,2
]}

Trivellin, N. ^{[1
,2
]}

Mura, G. ^{[3
]}

Vanzi, M. ^{[3
]}

Meneghesso, G. ^{[1
,2
]}

Zanoni, E. ^{[1
,2
]}

机构：

[1] Univ Padua, Dept Informat Engn, I-35131 Padua, Italy

[2] LightCube SRL, I-35129 Padua, Italy

[3] Univ Cagliari, Dept Elect & Elect Engn, Cagliari, Italy

来源：

MICROELECTRONICS RELIABILITY | 2012年 / 52卷 / 9-10期

关键词：

Activation energy - Degradation - Thermodynamic stability - III-V semiconductors - Light emitting diodes - Light emission;

D O I：

10.1016/j.microrel.2012.06.036

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The aim of this work is to investigate the thermal stability of remote phosphor plates to be used in solid-state lighting systems, for the conversion of the blue light emitted by GaN-based LEDs into white light. A preliminary thermal characterization revealed that in normal conditions of blue light irradiance the phosphor plates can reach temperature levels higher than 60 degrees C, which can affect both performance and reliability. The results of accelerated thermal stress tests indicate that high temperature levels can trigger a relevant degradation mechanism (estimated activation energy is 1.2 eV), that drastically reduces the phosphor conversion efficiency and modifies the photometric and colorimetric characteristics of the emitted white light. (C) 2012 Published by Elsevier Ltd.

引用

页码：2164 / 2167

页数：4

共 4 条

[1]

Fan BF, 2007, IEEE PHOTONIC TECH L, V19, P1121, DOI 10.1109/LPT.2007.901098

[2] Optical Analysis of Color Distribution in White LEDs With Various Packaging Methods [J].