X-ray and EUV micro-imaging systems for laser ICF diagnostics

被引：0

作者：

Yi Shengzhen ^{[1
]}

Mu Baozhong ^{[1
]}

Wang Xin ^{[1
]}

Huang Wannian

Jiang Li ^{[1
]}

Wang Zhanshan ^{[1
]}

机构：

[1] Tongji Univ, Shanghai 200092, Peoples R China

来源：

11TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY (XRM2012) | 2013年 / 463卷

关键词：

KIRKPATRICK-BAEZ MICROSCOPE;

D O I：

10.1088/1742-6596/463/1/012049

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Plasma imaging diagnostics plays an important role for laser ICF. Based on the urgent need to carry out high-resolution, high-throughput plasma diagnostics, grazing-incidence X-ray Kirkpatrick-Baez (KB) microscopes and normal-incidence EUV Schwarzschild imaging system were developed. The X-ray multilayer KB microscopes were successfully been applied in the physics experiments of SGII laser facility. Combined with streaked camera, the Mo-backlit implosion flow line of hollow Carbon-Hydrogen (CH) spherical target was obtained in SGII. The 4.75keV single-channel and four-channel KB microscopes were also developed for self-emission and short-pulse backlit imaging diagnostic of CH cylindrical target. In addition, according to the need of ultra-short laser pulse plasma diagnostics, the Schwarzschild imaging system working at 68eV was researched, and the physical experiments of hot electron transport with Schwarzschild imaging system were performed in SILEX-I laser facility.

引用

页数：4

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