Magnetic anisotropy in ilmenite- hematite solid solution thin films grown by pulsed laser ablation

被引：13
作者：
Rode, K. [1 ]
Gunning, R. D.
Sofin, R. G. S.
Venkatesan, M.
Lunney, J. G.
Coey, J. M. D.
Shvets, I. V.
机构：
[1] Trinity Coll Dublin, CRANN, Dublin 2, Ireland
来源：
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 2008年 / 320卷 / 23期
关键词：
Epitaxial film; Ferrimagnetics; Hematite; Ilmenite; Magnetic semiconductors; Magnetic anisotropy; Pulsed laser ablation; Spin electronics;
D O I：
10.1016/j.jmmm.2008.06.010
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Ferromagnetic thin films of the ilmenite-hematite solid solution Fe(2-x)Ti(x)O(3) with x = 0.6 and x = 0.8 have been grown on (0 0 1) sapphire substrates. X-ray diffraction analysis reveals that the films are single phase with the ilmenite (R (3) over bar) crystal structure. Strong easy-plane anisotropy is observed for the two films, which are nominally n or p type with K(1) = -8 x 10(6) J m(-3) for x = 0.6 and -11 x 10(6) J m(-3) for x = 0.8 at T = 4 K. The trigonal splitting of the (5)T(2g) energy level of Fe(2+) is inferred to be 0.11 eV, and the zero-field splitting parameter D to be equal to 15 K. (C) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码：3238 / 3241
页数：4
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