Approximation for Measuring Complex Material Parameters at λ/2 Resonances in Transmission-Line Measurements

被引:0
|
作者
Kim, Sung [1 ]
Baker-Jarvis, James [1 ]
机构
[1] NIST, Electromagnet Div, Boulder, CO 80305 USA
关键词
half-wavelength resonance; low-loss material; permeability; permittivity; transmission/reflection (T/R) method; PERMITTIVITY DETERMINATION; BAND;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We propose an approximation for removing resonant artifacts that arise in permittivity and permeability measurements when using the transmission/reflection (T/R) method at frequencies where the test sample length is an integer multiple of a half wavelength. In order to address this issue, we approximate the input impedance of the transmission-line fixture around the lambda/2 resonance with a simple algorithm based on a 1st-order regression. The characteristic impedance of the sample-loaded section of the fixture is computed from those regression coefficients, and the permittivity and permeability can be computed by assuming that the refractive index obtained from the conventional T/R method does not suffer from resonant artifacts. Our approximate results are validated when compared with those from one of the conventional T/R methods, the Nicolson-Ross-Weir (NRW) method.
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页码:803 / 805
页数:3
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