Dielectric relaxation in piezo-, pyro- and ferroelectric polyamide 11

Ferroelectric polyamide 11 films were prepared by melt-quenching, cold-drawing and electrical poling. Their ferroelectricity was studied by means of dielectric-hysteresis measurements. A remnant polarisation of up to 35 mC/m(2) and a coercive field of 75 MV/m were obtained. The piezoelectric d(33) coefficient and the pyroelectric coefficient of the films are reduced by annealing just below the melting region, but remain at about 3 pC/N and 8 muC/(m(2)K), respectively, during further heat treatment. Differential scanning calorimetry (DSC), dielectric relaxation spectroscopy (DRS) and thermally stimulated depolarisation (TSD) were applied for investigating the conformational changes induced by melt-quenching, cold-drawing and annealing. The results indicate that the cold-drawn film mainly consists of a rigid amorphous phase which exhibits considerably lower conductivity, no glass transition and consequently no dielectric a relaxation. Instead, an a, relaxation is found, which is related to chain motions in regions of the rigid amorphous phase where the amide-group dipoles are not perfectly ordered. Annealing removes imperfectly ordered structures, but does not affect the ferroelectric polarisation. Therefore, it may be concluded that essentially the a, relaxation causes the thermally non-stable part of the piezo- and pyroelectricity in polyamide 11.