Microstructural stability of Ag sinter joining in thermal cycling

被引:72
作者
Sakamoto, Soichi [1 ]
Sugahara, Tohru [1 ]
Suganuma, Katsuaki [1 ]
机构
[1] Osaka Univ, Inst Sci & Ind Res, Osaka, Japan
关键词
SIC DEVICES; POWER; SILVER; RELIABILITY; SOLDERS; ALLOYS;
D O I
10.1007/s10854-012-0929-9
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
As a heat-resistant die attach technology processed at low temperatures, three Ag filler-based sinter joining materials have been proposed. Among these, Ag flake pastes exhibited the greatest potential. Joining was carried out by sintering Ag nanoparticles/flakes in air at 200 A degrees C for 60 min. All of the joined samples survived up to 1,000 thermal cycles in a temperature range from -40 to 180/250 A degrees C with a 30 min dwell time. In particular, the joining strengths with the Ag micron and, Ag nano-thick flake pastes maintained excellent strength. Neither thermal fatigue cracks nor large voids were observed in the Ag sintered layers. Thus, low-temperature and low-pressure sinter joining with Ag flakes is expected to have an application in high power semiconductor devices for ultra-high temperature operation.
引用
收藏
页码:1332 / 1340
页数:9
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