The adhesion of copper films deposited onto aluminum nitride

被引:5
|
作者
Park, JW [1 ]
Pedraza, AJ
Lowndes, DH
机构
[1] Univ Tennessee, Dept Mat Sci & Engn, Knoxville, TN 37996 USA
[2] Oak Ridge Natl Lab, Div Solid State, Oak Ridge, TN 37831 USA
基金
美国国家科学基金会;
关键词
D O I
10.1023/A:1004544200291
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Good adhesion between copper film and AIN substrate is obtained when the surface of AIN is laser-irradiated prior to copper film deposition and post deposition annealing is conducted. Surface chemistry of AIN substrates before and after laser irradiation and the interfacial reactions of copper film/AIN couples were studied with Auger Electron Spectroscopy (AES) to understand the adhesion mechanisms. The surface of as-received AIN substrates was covered with a thin sheath of Al2O3 Laser irradiation removed the surface Al2O3 layers, smoothened the surface, and decomposed AIN leaving metallic aluminum on the surface. The interfacial reactions in the copper film/AIN couple are affected by the amounts of oxygen and metallic aluminum available at the interface. The adhesion mechanism is the formation of a Cu-O-Al compound at the interface of copper film/AIN couple. Since copper does not react with AIN, laser induced decomposition of AIN seems to be the driving force for the formation of the compound. (C) 1999 Kluwer Academic Publishers.
引用
收藏
页码:1933 / 1942
页数:10
相关论文
共 50 条
  • [21] SELECTIVE STUDIES OF CHEMICAL VAPOR-DEPOSITED ALUMINUM NITRIDE SILICON NITRIDE MIXTURE FILMS
    ZIRINSKY, S
    IRENE, EA
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1976, 123 (08) : C263 - C263
  • [22] SELECTIVE STUDIES OF CHEMICAL VAPOR-DEPOSITED ALUMINUM NITRIDE SILICON NITRIDE MIXTURE FILMS
    ZIRINSKY, S
    IRENE, EA
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1978, 125 (02) : 305 - 314
  • [23] Properties of Thick Printed Copper Films on Aluminum Nitride Substrates
    Hlina, Jiri
    Reboun, Jan
    Hamacek, Ales
    2021 44TH INTERNATIONAL SPRING SEMINAR ON ELECTRONICS TECHNOLOGY (ISSE), 2021,
  • [24] Preparation and Breakdown Property of Aluminum Oxide Thin Films Deposited onto Anodized Aluminum Substrate
    Yao, Manwen
    Chen, Jianwen
    Yang, Pengfei
    Shan, Wei
    Hu, Baofu
    Yao, Xi
    FERROELECTRICS, 2013, 455 (01) : 21 - 28
  • [25] Thin, continuous, and conformal copper films by reduction of atomic layer deposited copper nitride
    Li, Zhengwen
    Gordon, Roy G.
    CHEMICAL VAPOR DEPOSITION, 2006, 12 (07) : 435 - 441
  • [26] CRYSTALLOGRAPHIC STRUCTURE AND ADHESION OF ALUMINUM THIN-FILMS DEPOSITED ON MYLAR
    SILVAIN, JF
    EHRHARDT, JJ
    PICCO, A
    LUTGEN, P
    ACS SYMPOSIUM SERIES, 1990, 440 : 453 - 466
  • [27] The effect of hydrogen on copper nitride thin films deposited by magnetron sputtering
    Zhang, Guangan
    Yan, Pengxun
    Wu, Zhiguo
    Wang, Jun
    Chen, Jiangtao
    APPLIED SURFACE SCIENCE, 2008, 254 (16) : 5012 - 5015
  • [28] Investigation on visible emission of ZnO films deposited on copper nitride substrates
    Ding, Jijun
    Chen, Haixia
    Li, Huidong
    Fu, Haiwei
    2019 IEEE 19TH INTERNATIONAL CONFERENCE ON NANOTECHNOLOGY (IEEE-NANO 2019), 2019, : 125 - 128
  • [29] Influence of bias voltage on copper nitride films deposited by reactive sputtering
    Pierson, JF
    SURFACE ENGINEERING, 2003, 19 (01) : 67 - 69
  • [30] Addition of silver in copper nitride films deposited by reactive magnetron sputtering
    Pierson, J. F.
    Horwat, D.
    SCRIPTA MATERIALIA, 2008, 58 (07) : 568 - 570