A 0.5-V 5.2-fJ/Conversion-Step Full Asynchronous SAR ADC With Leakage Power Reduction Down to 650 pW by Boosted Self-Power Gating in 40-nm CMOS

被引:33
作者
Sekimoto, Ryota [1 ]
Shikata, Akira [2 ]
Yoshioka, Kentaro [3 ]
Kuroda, Tadahiro [4 ]
Ishikuro, Hiroki [3 ]
机构
[1] Canon Inc, Tokyo 1468501, Japan
[2] Analog Devices Inc, Japan Design Ctr, Tokyo 1056891, Japan
[3] Keio Univ, Yokohama, Kanagawa 2238522, Japan
[4] Keio Univ, Keio Kuroda Lab, Yokohama, Kanagawa 2238522, Japan
关键词
Asynchronous; data converter; leakage power; low-power; low-voltage; power gating; successive-approximation-register (SAR) ADC; MU-W; BIT;
D O I
10.1109/JSSC.2013.2274851
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents an ultralow-power and ultralow-voltage SAR ADC. Full asynchronous operation and boosted self-power gating are proposed to improve conversion accuracy and reduce static leakage power. By designing with MOSFET of high threshold voltage (HVt) and low threshold voltage (LVt), the leakage power is reduced without decrease of maximum sampling frequency. The test chip in 40-nm CMOS process has successfully reduced leakage power by 98%, and it achieves 8.2-bit ENOB and while consuming only 650 pW at 0.1 kS/s from 0.5-V power supply. The power consumption is scalable up to 4 MS/s and power supply range from 0.4 to 0.7 V. The best figure of merit at 0.5 V is 5.2 fJ/conversion-step at 20 kS/s.
引用
收藏
页码:2628 / 2636
页数:9
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