Near field magneto-optical circular dichroism using an apertureless probe

被引：13

作者：

Bergossi, O ^{[1
]}

Wioland, H ^{[1
]}

Hudlet, S ^{[1
]}

Deturche, R ^{[1
]}

Royer, P ^{[1
]}

机构：

[1] Univ Technol Troyes, Lab Nanotechnol & Instrumentat Opt, F-10010 Troyes, France

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1999年 / 38卷 / 6AB期

关键词：

near field optics; magneto-optics; magnetic circular dichroism; apertureless probe; scanning near field optical microscope (SNOM); atomic force microscope (AFM);

D O I：

10.1143/JJAP.38.L655

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We present an original magneto-optical Scanning Near-field-Optical Microscope (SNOM) configuration,, using an apertureless probe, and devoted to the characterization in transmission of magnetic samples. Our experimental device provides simultaneously the near and far field optical images, in Magneto-optical Circular Dichroism mode (MCD): and the sample surface topography. The preliminary near field images of an iron garnet test-sample reveal surface modifications in the magnetic domain distribution, unresolved in the far field image, and unrelated to the topographic features. The near field image resolution reaches 240 nm, corresponding to the theoretically estimated size of the smallest magnetic structures.

引用

页码：L655 / L658

页数：4

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