Line-defect calibration for line-scanning projection display

被引:1
|
作者
An, Seungdo [1 ]
Song, Jonghyeong [1 ]
Lapchuk, Anatoliy [1 ,2 ]
Yurlov, Victor [1 ]
Ryu, Seung-Won [1 ]
Kim, Eungju [1 ]
Yun, Sang Kyeong [1 ]
机构
[1] Samsung Electromech Co Ltd, OS Div, SOM R&D & Biz Grp, Suwon 442743, South Korea
[2] Inst Informat Recording NAS Ukraine, UA-03113 Kiev, Ukraine
来源
OPTICS EXPRESS | 2009年 / 17卷 / 19期
关键词
D O I
10.1364/OE.17.016492
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A method of line-defect calibration for line-scanning projection display is developed to accomplish acceptable display uniformity. The line scanning display uses a line modulating imaging and scanning device to construct a two-dimensional image. The inherent line-defects in an imaging device and optical lenses are the most fatal performance-degrading factor that should be overcome to reach the basic display uniformity level. Since the human eye recognizes line defects very easily, a method that perfectly removes line defects is required. Most line imaging devices are diffractive optical devices that require a coherent light source. This particular requirement makes the calibration method of sequential single pixel measurement and correction insufficient to take out the line defects distributed on screen due to optical crosstalk. In this report, we present a calibration method using a recursively converging algorithm that successfully transforms the unacceptable line-defected images into a uniform display image. (C) 2009 Optical Society of America
引用
收藏
页码:16492 / 16504
页数:13
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