Practical Framework: Implementing OEE Method in Manufacturing Process Environment

被引:2
作者
Maideen, N. C. [1 ]
Sahudin, S. [2 ]
Yahya, N. H. Mohd [1 ]
Norliawati, A. O. [1 ]
机构
[1] Univ Teknol MARA Pulau Pinang, Fac Mech Engn, Permatang Pauh 13500, Pulau Pinang, Malaysia
[2] Univ Malaysia Perlis, Fac Environm Engn, Arau 02600, Perlis, Malaysia
来源
2ND INTERNATIONAL MANUFACTURING ENGINEERING CONFERENCE AND 3RD ASIA-PACIFIC CONFERENCE ON MANUFACTURING SYSTEMS (IMEC-APCOMS 2015) | 2016年 / 114卷
关键词
D O I
10.1088/1757-899X/114/1/012093
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Manufacturing process environment requires reliable machineries in order to be able to satisfy the market demand. Ideally, a reliable machine is expected to be operated and produce a quality product at its maximum designed capability. However, due to some reason, the machine usually unable to achieved the desired performance. Since the performance will affect the productivity of the system, a measurement technique should be applied. Overall Equipment Effectiveness (OEE) is a good method to measure the performance of the machine. The reliable result produced from OEE can then be used to propose a suitable corrective action. There are a lot of published paper mentioned about the purpose and benefit of OEE that covers what and why factors. However, the how factor not yet been revealed especially the implementation of OEE in manufacturing process environment. Thus, this paper presents a practical framework to implement OEE and a case study has been discussed to explain in detail each steps proposed. The proposed framework is beneficial to the engineer especially the beginner to start measure their machine performance and later improve the performance of the machine.
引用
收藏
页数:11
相关论文
共 6 条
[1]   Correlating Failure Mode Effect Analysis (FMEA) & Overall Equipment Effectiveness (OEE) [J].
Ahire, Chandrajit P. ;
Relkar, Anand S. .
INTERNATIONAL CONFERENCE ON MODELLING OPTIMIZATION AND COMPUTING, 2012, 38 :3482-3486
[2]  
Bamber C. J., 2003, Journal of Quality in Maintenance Engineering, V9, P223, DOI 10.1108/13552510310493684
[3]  
Chakravarthy Gokul R., 2007, 2007 IEEE/SEMI Advanced Semiconductor Manufacturing Conference, P306, DOI 10.1109/ASMC.2007.375055
[4]  
Nakajima S., 1988, INTRO TPM TOTAL PROD
[5]   Optimizing & Analysing Overall Equipment Effectiveness (OEE) Through Design of Experiments (DOE) [J].
Relkar, Anand S. ;
Nandurkar, K. N. .
INTERNATIONAL CONFERENCE ON MODELLING OPTIMIZATION AND COMPUTING, 2012, 38 :2973-2980
[6]  
Samat H. A, 2012, S AFRICAN J IND ENG, V23