WSXM:: A software for scanning probe microscopy and a tool for nanotechnology

被引：7069
作者：
Horcas, I.
Fernandez, R.
Gomez-Rodriguez, J. M.
Colchero, J.
Gomez-Herrero, J.
Baro, A. M.
机构：
[1] Nanotec Elect SL, Ctr Empresaial Euronova, E-28049 Madrid, Spain
[2] Univ Autonoma Madrid, Dept Fis Mat Condensada, Lab Nuevas Microscopias, E-28049 Madrid, Spain
[3] Univ Murcia, Fac Quim, Dept Fis, E-30100 Murcia, Spain
[4] Univ Autonoma Madrid, Dept Fis Mat Condensada, Dept Fis, E-28049 Madrid, Spain
[5] Univ Autonoma Madrid, Dept Fis Mat Condensada, Lab Neuvas Microscopias, E-28049 Madrid, Spain
[6] CSIC, Inst Ciencias Mat, E-28049 Madrid, Spain
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2007年 / 78卷 / 01期
关键词：
D O I：
10.1063/1.2432410
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out. (c) 2007 American Institute of Physics.
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页数：8
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