Prediction of analog performance parameters using fast transient testing

被引：197
作者：
Variyam, PN [1 ]
Cherubal, S
Chatterjee, A
机构：
[1] Texas Instruments Inc, Dallas, TX 75243 USA
[2] Ardext Technol, Atlanta, GA 30332 USA
[3] Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA
来源：
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 2002年 / 21卷 / 03期
关键词：
analog specification prediction; mixed-signal circuit testing; test generation;
D O I：
10.1109/43.986428
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
In this paper, a fast transient testing methodology for predicting the performance parameters of analog circuits is presented. A transient test signal is applied to the circuit under (cut) test and the transient response of the circuit is sampled and analyzed to predict the circuit's performance parameters. An algorithm for generating the optimum transient test signal is presented. The methodology is demonstrated in a production environment using a low-power opamp. Result from production test data showed: 1) a ten times speedup in production testing; 2) accurate prediction of the performance parameters; and (3) a simpler test configuration.
引用
收藏
页码：349 / 361
页数：13
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