Evidence of band bending and surface Fermi level pinning in graphite oxide

被引:9
作者
Jeong, Hae Kyung [1 ]
Hong, Lingmei [2 ]
Zhang, Xin [2 ]
Vega, Eduardo [2 ]
Dowben, P. A. [2 ]
机构
[1] Daegu Univ, Inst Basic Sci, Dept Phys, Gyongsan 712714, South Korea
[2] Univ Nebraska, Dept Phys & Astron, Nebraska Ctr Mat & Nanosci, Lincoln, NE 68588 USA
基金
美国国家科学基金会; 新加坡国家研究基金会;
关键词
INVERSE-PHOTOEMISSION; ELECTRONIC-STRUCTURE; GRAPHENE;
D O I
10.1016/j.carbon.2013.01.067
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We present the electronic structure of graphite oxide in the vicinity of the Fermi level measured using ultraviolet photoemission and inverse photoemission spectroscopies and compare it with X-ray absorption spectra. The expected p-type behavior of graphite oxide is not observed at the surface and the presence of band bending is invoked. The observed electronic structure of graphite oxide exhibited an n-type semiconducting band structure with a band gap of 2.3 +/- 0.4 eV. An oxygen related state, at 0.8 eV above Fermi level, and the suppression of the unoccupied carbon weighted states at the conduction band minimum suggests that the oxygen vacancies at the surface of graphite oxide contribute to the n-type semiconducting electronic structure of the surface. (C) 2013 Elsevier Ltd. All rights reserved.
引用
收藏
页码:227 / 231
页数:5
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