Rescuing Memristor-based Neuromorphic Design with High Defects

被引:14
作者
Liu, Chenchen [1 ]
Hu, Miao [2 ]
Strachan, John Paul [2 ]
Li, Hai [3 ]
机构
[1] Univ Pittsburgh, Dept Elect & Comp Engn, Pittsburgh, PA 15260 USA
[2] Hewlett Packard Labs, Palo Alto, CA USA
[3] Duke Univ, Dept Elect & Comp Engn, Durham, NC 27706 USA
来源
PROCEEDINGS OF THE 2017 54TH ACM/EDAC/IEEE DESIGN AUTOMATION CONFERENCE (DAC) | 2017年
基金
美国国家科学基金会;
关键词
NETWORK;
D O I
10.1145/3061639.3062310
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Memristor-based synaptic network has been widely investigated and applied to neuromorphic computing systems for the fast computation and low design cost. As memristors continue to mature and achieve higher density, bit failures within crossbar arrays can become a critical issue. These can degrade the computation accuracy significantly. In this work, we propose a defect rescuing design to restore the computation accuracy. In our proposed design, significant weights in a specified network are first identified and retraining and remapping algorithms are described. For a two layer neural network with 92.64% classification accuracy on MNIST digit recognition, our evaluation based on real device testing shows that our design can recover almost its full performance when 20% random defects are present.
引用
收藏
页数:6
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