Aggregation of conjugated polymer nanowires studied by atomic force microscopy and kelvin probe force microscopy

被引：0
|
作者：
Guo, Song [1 ]
机构：
[1] Univ Southern Mississippi, Hattiesburg, MS USA
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2017年 / 254卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
300
引用
收藏
页数：1
相关论文
共 50 条
  • [41] Volta Potential of Oxidized Aluminum Studied by Scanning Kelvin Probe Force Microscopy
    Yasakau, Kiryl A.
    Salak, Andrei N.
    Zheludkevich, Mikhail L.
    Ferreira, Mario G. S.
    JOURNAL OF PHYSICAL CHEMISTRY C, 2010, 114 (18): : 8474 - 8484
  • [42] Carrier density distribution in silicon nanowires investigated by scanning thermal microscopy and Kelvin probe force microscopy
    Wielgoszewski, Grzegorz
    Paletko, Piotr
    Tomaszewski, Daniel
    Zaborowski, Michal
    Jozwiak, Grzegorz
    Kopiec, Daniel
    Gotszalk, Teodor
    Grabiec, Piotr
    MICRON, 2015, 79 : 93 - 100
  • [43] Energetic Material/Polymer Interaction Studied by Atomic Force Microscopy
    Oxley, Jimmie C.
    Smith, James L.
    Kagan, Gerald L.
    Zhang, Guang
    Swanson, Devon S.
    PROPELLANTS EXPLOSIVES PYROTECHNICS, 2016, 41 (04) : 623 - 628
  • [44] Kelvin Probe Force Microscopy and Electrochemical Atomic Force Microscopy Investigations of Lithium Nucleation and Growth: Influence of the Electrode Surface Potential
    To-A-Ran, Weerawat
    Mastoi, Naila Riaz
    Ha, Chae Yeon
    Song, Young Jae
    Kim, Young-Jun
    JOURNAL OF PHYSICAL CHEMISTRY LETTERS, 2024, 15 (28): : 7265 - 7271
  • [45] Probing CO on a rutile TiO2(110) surface using atomic force microscopy and Kelvin probe force microscopy
    Adachi, Yuuki
    Sugawara, Yasuhiro
    Li, Yan Jun
    NANO RESEARCH, 2022, 15 (03) : 1909 - 1915
  • [46] Probing CO on a rutile TiO2(110) surface using atomic force microscopy and Kelvin probe force microscopy
    Yuuki Adachi
    Yasuhiro Sugawara
    Yan Jun Li
    Nano Research, 2022, 15 : 1909 - 1915
  • [47] Investigation of the Surface Potential on Iron Nanoparticles During the Corrosion by Atomic Force Microscopy (AFM) and Kelvin Probe Force Microscopy (KFM)
    Raj, X. Joseph
    Nishimura, T.
    INTERNATIONAL JOURNAL OF ELECTROCHEMICAL SCIENCE, 2014, 9 (04): : 2090 - 2100
  • [48] Atomic force microscopy and Kelvin probe force Microscopy measurements of semiconductor surface using carbon nanotube tip fabricated by electrophoresis
    Maeda, C
    Ozeki, N
    Kishimoto, S
    Mizutani, T
    Sugai, T
    Shinohara, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2002, 41 (4B): : 2615 - 2619
  • [49] Atomic force microscopy and Kelvin probe force microscopy evidence of local structural inhomogeneity and nonuniform dopant distribution in conducting polybithiophene
    Semenikhin, OA
    Jiang, L
    Iyoda, T
    Hashimoto, K
    Fujishima, A
    JOURNAL OF PHYSICAL CHEMISTRY, 1996, 100 (48): : 18603 - 18606
  • [50] Scanning probe study on the photovoltaic characteristics of a Si solar cell by using Kelvin force microscopy and photoconductive atomic force microscopy
    Heo, Jinhee
    Won, Soonho
    THIN SOLID FILMS, 2013, 546 : 353 - 357
12345