Aggregation of conjugated polymer nanowires studied by atomic force microscopy and kelvin probe force microscopy

被引:0
|
作者
Guo, Song [1 ]
机构
[1] Univ Southern Mississippi, Hattiesburg, MS USA
关键词
D O I
暂无
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
300
引用
收藏
页数:1
相关论文
共 50 条
  • [1] ATOMIC ORDERING OF GAINP STUDIED BY KELVIN PROBE FORCE MICROSCOPY
    LENG, Y
    WILLIAMS, CC
    SU, LC
    STRINGFELLOW, GB
    APPLIED PHYSICS LETTERS, 1995, 66 (10) : 1264 - 1266
  • [2] Elemental Identification by Combining Atomic Force Microscopy and Kelvin Probe Force Microscopy
    Schulz, Fabian
    Ritala, Juha
    Krejci, Ondrej
    Seitsonen, Ari Paavo
    Foster, Adam S.
    Liljeroth, Peter
    ACS NANO, 2018, 12 (06) : 5274 - 5283
  • [3] Layered Poly(3-hexylthiophene) Nanowhiskers Studied by Atomic Force Microscopy and Kelvin Probe Force Microscopy
    McFarland, Frederick M.
    Brickson, Benjamin
    Guo, Song
    MACROMOLECULES, 2015, 48 (09) : 3049 - 3056
  • [4] Current and potential characterization on InAs nanowires by contact-mode atomic force microscopy and Kelvin probe force microscopy
    Ono, S
    Takeuchi, M
    Takahashi, T
    ULTRAMICROSCOPY, 2002, 91 (1-4) : 127 - 132
  • [5] The resistive switching in TiO2 films studied by conductive atomic force microscopy and Kelvin probe force microscopy
    Du, Yuanmin
    Kumar, Amit
    Pan, Hui
    Zeng, Kaiyang
    Wang, Shijie
    Yang, Ping
    Wee, Andrew Thye Shen
    AIP ADVANCES, 2013, 3 (08):
  • [6] Atomic and Kelvin probe force microscopy of thin films
    Alessandrini, A
    Valdrè, U
    PROCEEDINGS OF THE 5TH MULTINATIONAL CONGRESS ON ELECTRON MICROSCOPY, 2001, : 553 - 554
  • [7] KELVIN PROBE FORCE MICROSCOPY
    NONNENMACHER, M
    OBOYLE, MP
    WICKRAMASINGHE, HK
    APPLIED PHYSICS LETTERS, 1991, 58 (25) : 2921 - 2923
  • [8] Pulsed Force Kelvin Probe Force Microscopy
    Jakob, Devon S.
    Wang, Haomin
    Xu, Xiaoji G.
    ACS NANO, 2020, 14 (04) : 4839 - 4848
  • [9] Kelvin probe force microscopy study of conjugated polymer/fullerene organic solar cells
    Glatzel, T
    Hoppe, H
    Sariciftci, NS
    Lux-Steiner, MC
    Komiyama, M
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2005, 44 (7B): : 5370 - 5373
  • [10] Hydrogenated diamond surfaces studied by atomic and Kelvin force microscopy
    Rezek, B
    Nebel, CE
    Stutzmann, M
    DIAMOND AND RELATED MATERIALS, 2004, 13 (4-8) : 740 - 745