X-ray intensity decrease from absorption effects in mechanically milled systems

被引:18
作者
Leonard, RT
Koch, CC
机构
[1] North Carolina State University, Dept. of Mat. Sci. and Engineering, Box 7907, Raleigh
关键词
D O I
10.1016/S1359-6462(96)00333-8
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Mixing strong and weak x-ray absorbers will result in changes in the diffraction intensity, which can be predicted by the preceding model given by Klug and Alexander. The level of mixing, however, is important: with large powder particles the diffraction reveals the composition of the powder with no anomalous decrease in intensity; with small particle powders intermixed by means such as mechanical milling, the diffraction intensity will change in accordance with the materials' linear absorption. The component with the lower x-ray linear absorption coefficient will exhibit much lower diffraction intensities than a rule of mixtures would predict. Good quantitative agreement between experimental intensities for the Si/Sn system and those predicted by the Klug and Alexander model was observed.
引用
收藏
页码:41 / 46
页数:6
相关论文
共 11 条
[1]  
ATZMON M, COMMUNICATION
[2]   FORMATION OF AMORPHOUS FE-B ALLOYS BY MECHANICAL ALLOYING [J].
CALKA, A ;
RADLINSKI, AP .
APPLIED PHYSICS LETTERS, 1991, 58 (02) :119-121
[3]  
GAFFET E, 1990, J LESS-COMMON MET, V49, P146
[4]  
Ivanov E., 1993, J MATER SYNTH PROC, V1, P405
[5]   MELTING AND POSSIBLE AMORPHIZATION OF SN AND PB IN GE/SN AND GE/PB MECHANICALLY MILLED POWDERS [J].
JANG, JSC ;
KOCH, CC .
JOURNAL OF MATERIALS RESEARCH, 1990, 5 (02) :325-333
[6]  
Klug H.P., 1974, XRAY DIFFRACTION PRO, V2nd, P992
[7]  
KOCH CC, 1991, PROCESSING METALS AL, V15
[8]   Nanoscale composites of Si/Sn and Ge/Sn synthesized by mechanical attrition [J].
Leonard, R.T. ;
Koch, C.C. .
Nanostructured Materials, 1992, 1 (06)
[9]  
LEONARD RT, 1994, THESIS N CAROLINA ST
[10]   MECHANICAL ALLOYING OF HIGH MELTING-POINT INTERMETALLICS [J].
RADLINSKI, AP ;
CALKA, A .
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 1991, 134 :1376-1379