Experimental and numerical investigation of two mechanisms underlying runaway electron beam formation

被引：7

作者：

Baksht, E. Kh. ^{[1
]}

Belomyttsev, S. Ya. ^{[1
]}

Burachenko, A. G. ^{[1
]}

Ryzhov, V. V. ^{[1
]}

Tarasenko, V. F. ^{[1
]}

Shklyaev, V. A. ^{[1
]}

机构：

[1] Russian Acad Sci, Inst High Current Elect, Siberian Branch, Tomsk 634055, Russia

来源：

TECHNICAL PHYSICS | 2012年 / 57卷 / 07期

关键词：

DISCHARGES; NITROGEN; VOLTAGE;

D O I：

10.1134/S1063784212070031

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The electrical breakdown of a gas-filled diode with a highly nonuniform electric field is studied in the case when a 25-kV voltage pulse generates runaway electron beams with time-separated maxima of different duration behind anode foil. Experimental data are analyzed and numerically simulated using the PIC/MC code OOPIC-Pro. It is shown that, in terms of the model used, both beams arise at the cathode but their formation mechanisms differ. The first runaway electron beam no longer than 500 ps is attributed to the ionization mechanism; the second one, which may last several nanoseconds, is due to emission.

引用

页码：998 / 1002

页数：5

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