Pressure-dependent EXAFS mean-square relative displacements of germanium and silicon crystals

被引:8
作者
Ho Khac Hieu [1 ]
Vu Van Hung [2 ]
机构
[1] Duy Tan Univ, Res & Dev Ctr Sci & Technol, Danang, Vietnam
[2] Viet Nam Educ Publishing House, Hanoi, Vietnam
关键词
pressure effects; mean-square relative displacement; Debye-Waller factor; EXAFS cumulants; thermodynamic quantities; statistical moment method; EQUATION-OF-STATE; THERMODYNAMIC PROPERTIES; UNIVERSAL EQUATION; TEMPERATURE; SI; PHASES; ORDER;
D O I
10.1080/08957959.2013.849346
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
In this paper, the statistical moment method (SMM) has been developed to study the pressure dependence of thermodynamic quantities of germanium and silicon crystals. We have derived the analytical expressions of the pressure-dependent parallel mean-square relative displacement (MSRD) or extended X-ray absorption fine structure (EXAFS) Debye-Waller factor, mean-square displacement (MSD) as well as lattice constant and volume change of diamond-type crystals. Numerical calculations performed for these semiconductors up to 11 GPa are found to be in good and reasonable agreement with available experimental data as well as with previous theoretical studies. Our results indicate that the SMM can be efficiently used for determining the relative change of the pressure-dependent MSRDs of germanium and silicon semiconductors. The research also shows the advantage of SMM on studying other thermodynamic properties of materials under high pressures.
引用
收藏
页码:768 / 776
页数:9
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