Microstructural analysis of AU/NI multilayers interfaces by SAXS and STM

被引：12

作者：

Labat, S ^{[1
]}

Guichet, C

Thomas, O

Gilles, B

Marty, A

机构：

[1] Fac Sci & Tech St Jerome, TECSEN, UMR 6122, F-13397 Marseille, France

[2] Fac Sci & Tech St Jerome, IPBM, F-13397 Marseille, France

[3] CEA, DRFMC, SP2M, Ctr Etud Nucl, F-38054 Grenoble, France

来源：

APPLIED SURFACE SCIENCE | 2002年 / 188卷 / 1-2期

关键词：

multilayers; roughness; STM; X-ray scattering; numerical simulations;

D O I：

10.1016/S0169-4332(01)00739-5

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We have investigated the inter-face roughness in Au/Ni multilayers by scanning tunnelling microscopy (STM) and small angles X-ray scattering. The comparison of the roughness statistical parameters deduced from these two techniques is reported. A good agreement is found for the xi values but not for the h values. A linear relationship between xi and the grain size has been evidenced from STM images and numerical simulations. (C) 2002 Elsevier Science B.V. All rights reserved.

引用

页码：182 / 187

页数：6

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