The ESRF beamline ID26:: X-ray absorption on ultra dilute sample

被引：133

作者：

Gauthier, C ^{[1
]}

Solé, VA ^{[1
]}

Signorato, R ^{[1
]}

Goulon, J ^{[1
]}

Moguiline, E ^{[1
]}

机构：

[1] European Synchrotron Radiat Facil, F-38043 Grenoble, France

来源：

JOURNAL OF SYNCHROTRON RADIATION | 1999年 / 6卷

关键词：

XAFS spectroscopy; dilute samples; instrumentation;

D O I：

10.1107/S0909049598016835

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The ESRF beamline ID26 is dedicated to XAFS studies on Ultra-diluted Samples (XAUS beamline). The spectral range 2.3-30 keV is covered. The aim of the beamline is to extract structural and electronic information on dilute samples for which the concentration of the absorbing element ranges from a few ppm up to 10 000 ppm. A wide range of applications is covered in biology, catalysis, chemistry, environmental sciences, solid state physics, etc. The beamline accepted the first users in November 1997. We give herein a brief description of the beamline and report on recent results.

引用

页码：164 / 166

页数：3

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