Study of Gain Test Method for Charge Coupled Device

The photoelectric performance of CCD is an important project, the test of it is the key technology to realize precision remote sensing. The CCD gain is a required parameter, which can be used to calculate the quantum efficiency, account the dynamic range and so on. The traditional gain test methods at present are the photon transfer curve method and the Fe55 method, the former is more popular because of its simple test equipment. This paper derives the gain test principle based on the photon transfer curve method, analyses the mathematical relationship between the shot noise and the gain, suggests the limitation of the traditional single pixel statistical method, and proposes a new method to calculate the temporal noise based on uniformity correction. In addition, this paper also builds the gain testing system for CCD, and obtains two sets of experimental data using the two methods, the test data indicates that there is a good agreement with the manufacturer's value, the traditional method has 0.94% difference, while the new method has 1.96% difference, which guarantees the accuracy and availability of the new method.