High Peak Power DUV Laser Processing

被引:2
|
作者
Kamba, Yasuhiro [1 ]
Igarashi, Hironori [1 ]
Onose, Takashi [1 ]
Miura, Taisuke [1 ]
Nohdomi, Ryoichi [1 ]
Oizumi, Hiroaki [1 ]
Murakami, Yoshihiko [1 ]
Fuchimukai, Atsushi [1 ]
Qu, Chen [1 ]
Tamaru, Yuki [1 ]
Tanaka, Yohei [1 ]
Sasaki, Yuujirou [1 ]
Fujimoto, Junichi [1 ]
Mizoguchi, Hakaru [1 ]
机构
[1] Gigaphoton Inc, 400 Yokokurashinden, Oyama, Tochigi 3238558, Japan
来源
HIGH-POWER LASER MATERIALS PROCESSING: APPLICATIONS, DIAGNOSTICS, AND SYSTEMS IX | 2020年 / 11273卷
关键词
DUV; short pulse; high peak power; CMC; Drilling;
D O I
10.1117/12.2549826
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Deep ultra-violet (DUV) laser and short pulse lasers are used for laser processing, because they can decrease the heat effect for process materials. We are developing a hybrid ArF excimer laser that is consists of a solid-state laser, multi wavelength conversion and ArF excimer amplifier. This laser can generate DUV light of 193 nm wavelength short pulse width. In this research, we demonstrated laser drilling on ultra-high temperature structural material that is silicon carbide ceramic matrix composites (SiC-CMC) using high peak power DUV laser. The removal rate was 150 nm/shot with 460 ps pulse. This rate was more than 4 times higher than ArF excimer laser (20 ns pulse width). The HAZ was also reduced by using high peak power DUV light source.
引用
收藏
页数:6
相关论文
共 50 条
  • [31] High-peak-power nanosecond pulse laser at 915 nm based on all-fiber structure
    Zhang, Qian
    Hou, Yubin
    Li, Xiaoli
    Zhao, He
    Wang, Pu
    OPTICS AND LASER TECHNOLOGY, 2025, 181
  • [32] Laser-damage-resistant photoalignment layers for high-peak-power liquid crystal device applications
    Marshall, K. L.
    Gan, J.
    Mitchell, G.
    Papernov, S.
    Rigatti, A. L.
    Schmid, A. W.
    Jacobs, S. D.
    LIQUID CRYSTAL XII, 2008, 7050
  • [33] High Peak Power Operation of a 1-μm GaAs-Based Optically Pumped Semiconductor Laser
    Laurain, Alexandre
    Wang, Tsuei-Lian
    Yarborough, Michael J.
    Hader, Jorg
    Moloney, Jerome V.
    Koch, Stephan W.
    Kunert, Bernardette
    Stolz, Wolfgang
    IEEE PHOTONICS TECHNOLOGY LETTERS, 2012, 24 (05) : 380 - 382
  • [34] High peak power sub-nanosecond mode-locked pulse characteristics of Nd:GGG laser
    Zhao, Jia
    Zhao, Shengzhi
    Li, Tao
    Li, Yufei
    Yang, Kejian
    Li, Guiqiu
    Li, Dechun
    Qiao, Wenchao
    Feng, Chuansheng
    Wang, Yonggang
    OPTICS AND LASER TECHNOLOGY, 2015, 73 : 162 - 165
  • [35] Absorptance measurements for the DUV spectral range by laser calorimetry
    Blaschke, H
    Jupé, M
    Ristau, D
    LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 2002 AND 7TH INTERNATIONAL WORKSHOP ON LASER BEAM AND OPTICS CHARACTERIZATION, 2003, 4932 : 467 - 474
  • [36] Efficient high-peak-power and high-repetition-rate eye-safe laser using an intracavity KTP OPO
    Guo, J.
    He, G. Y.
    Jiao, Z. X.
    Wang, B.
    LASER PHYSICS, 2015, 25 (03)
  • [37] Multiterawatt peak power generated by the all diode pumped laser - POLARIS
    Hein, J.
    Hornung, M.
    Boedefeld, R.
    Podleska, S.
    Saevert, A.
    Wachs, R.
    Kessler, A.
    Keppler, S.
    Wolf, M.
    Polz, J.
    Jaeckel, O.
    Nicolai, M.
    Schnepp, M.
    Koerner, J.
    Kaluza, M. C.
    Paulus, G. G.
    LIGHT AT EXTREME INTENSITIES: OPPORTUNITIES AND TECHNOLOGICAL ISSUES OF THE EXTREME LIGHT INFRASTRUCTURE, 2010, 1228 : 159 - +
  • [38] High-peak-power random Yb-fiber laser with intracavity Raman-frequency comb generation
    Liu, Xinxing
    Hao, Wenhui
    Yang, Zhihui
    Tang, Yulong
    HIGH POWER LASER SCIENCE AND ENGINEERING, 2022, 11
  • [39] High pulse energy extraction with high peak power from short-pulse, eye safe all-fiber laser system
    Savage-Leuchs, Matthias
    Eisenberg, Eric
    Liu, Anping
    Henrie, Jason
    Bowers, Mark
    FIBER LASERS III: TECHNOLOGY, SYSTEMS, AND APPLICATIONS, 2006, 6102
  • [40] A novel high-peak power double AO Q-switches pulse Nd:YAG laser for drilling
    Li, Q
    Zheng, YJ
    Wang, ZY
    Zuo, TC
    OPTICS AND LASER TECHNOLOGY, 2005, 37 (05) : 357 - 362