Interpreting motion and force for narrow-band intermodulation atomic force microscopy

被引:15
作者
Platz, Daniel [1 ]
Forchheimer, Daniel [1 ]
Tholen, Erik A. [2 ]
Haviland, David B. [1 ]
机构
[1] Royal Inst Technol KTH, Sect Nanostruct Phys, Albanova Univ Ctr, SE-10691 Stockholm, Sweden
[2] Intermodulat Prod AB, SE-16958 Solna, Sweden
关键词
atomic force microscopy; AFM; frequency combs; force spectroscopy; high-quality-factor resonators; intermodulation; multifrequency; MODE; SURFACES; CALIBRATION; RESOLUTION; SCALE;
D O I
10.3762/bjnano.4.5
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Intermodulation atomic force microscopy (ImAFM) is a mode of dynamic atomic force microscopy that probes the nonlinear tip-surface force by measurement of the mixing of multiple modes in a frequency comb. A high-quality factor cantilever resonance and a suitable drive comb will result in tip motion described by a narrow-band frequency comb. We show, by a separation of time scales, that such motion is equivalent to rapid oscillations at the cantilever resonance with a slow amplitude and phase or frequency modulation. With this time-domain perspective, we analyze single oscillation cycles in ImAFM to extract the Fourier components of the tip-surface force that are in-phase with the tip motion (F-I) and quadrature to the motion (F-Q). Traditionally, these force components have been considered as a function of the static-probe height only. Here we show that F-I and F-Q actually depend on both static-probe height and oscillation amplitude. We demonstrate on simulated data how to reconstruct the amplitude dependence of F-I and F-Q from a single ImAFM measurement. Furthermore, we introduce ImAFM approach measurements with which we reconstruct the full amplitude and probe-height dependence of the force components F-I and F-Q, providing deeper insight into the tip-surface interaction. We demonstrate the capabilities of ImAFM approach measurements on a polystyrene polymer surface.
引用
收藏
页码:45 / 56
页数:12
相关论文
共 41 条
[1]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[2]   Force measurements with the atomic force microscope: Technique, interpretation and applications [J].
Butt, HJ ;
Cappella, B ;
Kappl, M .
SURFACE SCIENCE REPORTS, 2005, 59 (1-6) :1-152
[3]   Energy dissipation in tapping-mode atomic force microscopy [J].
Cleveland, JP ;
Anczykowski, B ;
Schmid, AE ;
Elings, VB .
APPLIED PHYSICS LETTERS, 1998, 72 (20) :2613-2615
[4]  
Dürig U, 2000, APPL PHYS LETT, V76, P1203, DOI 10.1063/1.125983
[5]   A critical look at surface force measurement using a commercial atomic force microscope in the noncontact mode [J].
Fontaine, P ;
Guenoun, P ;
Daillant, J .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1997, 68 (11) :4145-4151
[6]   Model-based extraction of material properties in multifrequency atomic force microscopy [J].
Forchheimer, Daniel ;
Platz, Daniel ;
Tholen, Erik A. ;
Haviland, David B. .
PHYSICAL REVIEW B, 2012, 85 (19)
[7]   Patterning of silicon surfaces with noncontact atomic force microscopy:: Field-induced formation of nanometer-size water bridges [J].
García, R ;
Calleja, M ;
Rohrer, H .
JOURNAL OF APPLIED PHYSICS, 1999, 86 (04) :1898-1903
[8]   Attractive and repulsive tip-sample interaction regimes in tapping-mode atomic force microscopy [J].
García, R ;
San Paulo, A .
PHYSICAL REVIEW B, 1999, 60 (07) :4961-4967
[9]   Forces and frequency shifts in atomic-resolution dynamic-force microscopy [J].
Giessibl, FJ .
PHYSICAL REVIEW B, 1997, 56 (24) :16010-16015
[10]   Friction traced to the single atom [J].
Giessibl, FJ ;
Herz, M ;
Mannhart, J .
PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 2002, 99 (19) :12006-12010