共 41 条
[4]
Dürig U, 2000, APPL PHYS LETT, V76, P1203, DOI 10.1063/1.125983
[6]
Model-based extraction of material properties in multifrequency atomic force microscopy
[J].
PHYSICAL REVIEW B,
2012, 85 (19)
[8]
Attractive and repulsive tip-sample interaction regimes in tapping-mode atomic force microscopy
[J].
PHYSICAL REVIEW B,
1999, 60 (07)
:4961-4967
[9]
Forces and frequency shifts in atomic-resolution dynamic-force microscopy
[J].
PHYSICAL REVIEW B,
1997, 56 (24)
:16010-16015