Influence of temperature effects on sensitivity of surface plasmon resonance sensors

被引:1
作者
Moreira, C. S. [1 ,2 ]
Lima, A. M. N. [2 ]
Neff, H. [2 ]
机构
[1] CEFET AL, Dept Elect, BR-57020510 Maceio, AL, Brazil
[2] Univ Fed Campina Grande, Dept Elect Engn, BR-58109970 Campina Grande, PB, Brazil
来源
2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5 | 2008年
关键词
Surface Plasmon Resonance; Line broadening; Temperature Dependence; Drude Model;
D O I
10.1109/IMTC.2008.4547025
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The variation of instrumental sensitivity as function of environmental temperature of a Surface Plasmon Resonance (SPR) sensor has been exploited here experimentally and theoretically for both, angular and wavelength interrogation modes (AIM, WIM). A compact, robust commercial SPR device has been used, operating in the AIM at the range 275K < T < 320K. At temperature < 300K, S steadily deteriorates from 120 to 30 deg/RIU (refractive index unit). A singularity has been identified in the simulations, based on analytical and numerical approaches, near the freezing point of water, while a soft transition appears in the experiment. Towards higher device temperatures at 300K < T < 370K, instrumental sensitivities for both AIM and WIM decreases weakly. The effect is more pronounced at shorter wavelength <= 550nm, and in the WIM. A steady increase towards higher T was observed for the SPR-line broadening parameter in the AIM, but a distinct maximum resolved at 305K for wavelength interrogation.
引用
收藏
页码:170 / +
页数:2
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