Phase regeneration of DPSK signals in a silicon waveguide with reverse-biased p-i-n junction

被引:68
作者
Da Ros, Francesco [1 ]
Vukovic, Dragana [1 ]
Gajda, Andrzej [2 ,3 ]
Dalgaard, Kjeld [1 ]
Zimmermann, Lars [3 ]
Tillack, Bernd [2 ,3 ]
Galili, Michael [1 ]
Petermann, Klaus [2 ]
Peucheret, Christophe [1 ,4 ]
机构
[1] Tech Univ Denmark, Dept Photon Engn, DK-2800 Lyngby, Denmark
[2] TU Berlin, Inst Hochfrequenz & Halbleiter Syst Technol, D-10587 Berlin, Germany
[3] IHP, D-15236 Frankfurt, Oder, Germany
[4] Univ Rennes 1, FOTON Lab, CNRS UMR 6082, ENSSAT, F-22305 Lannion, France
关键词
SENSITIVE AMPLIFICATION;
D O I
10.1364/OE.22.005029
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Phase regeneration of differential phase-shift keying (DPSK) signals is demonstrated using a silicon waveguide as nonlinear medium for the first time. A p-i-n junction across the waveguide enables decreasing the nonlinear losses introduced by free-carrier absorption (FCA), thus allowing phase-sensitive extinction ratios as high as 20 dB to be reached under continuous-wave (CW) pumping operation. Furthermore the regeneration properties are investigated under dynamic operation for a 10-Gb/s DPSK signal degraded by phase noise, showing receiver sensitivity improvements above 14 dB. Different phase noise frequencies and amplitudes are examined, resulting in an improvement of the performance of the regenerated signal in all the considered cases. (C) 2014 Optical Society of America
引用
收藏
页码:5029 / 5036
页数:8
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