Structural and critical behaviors of ag rough films deposited on liquid substrates

被引：10

作者：

Ye, GX ^{[1
]}

Geng, CM ^{[1
]}

Zhang, ZR ^{[1
]}

Ge, HL ^{[1
]}

Zhang, XJ ^{[1
]}

机构：

[1] ZHEJIANG UNIV,DEPT PHYS,HANGZHOU 310027,PEOPLES R CHINA

来源：

CHINESE PHYSICS LETTERS | 1996年 / 13卷 / 10期

关键词：

D O I：

10.1088/0256-307X/13/10/016

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

A new Ag rough film system. deposited on silicone oil surfaces by rf-magnetron sputtering method, has been fabricated. The chrysanthemum-like surface morphology at micron length scale is observed, It is proposed that the anomalous critical behavior mainly results from the relative shift between the Ag atom clusters and the substrate. The discussion of the deposition mechanism is also presented.

引用

页码：772 / 774

页数：3

共 6 条

[1] SCANNING TUNNELING MICROSCOPY OBSERVATION OF SELF-AFFINE FRACTAL ROUGHNESS IN ION-BOMBARDED FILM SURFACES [J].