Covalent nitrogen doping in molecular beam epitaxy-grown and bulk WSe2

被引:25
作者
Khosravi, Ava [1 ]
Addou, Rafik [1 ]
Smyth, Christopher M. [1 ]
Yue, Ruoyu [1 ]
Cormier, Christopher R. [1 ]
Kim, Jiyoung [1 ]
Hinkle, Christopher L. [1 ]
Wallace, Robert M. [1 ]
机构
[1] Univ Texas Dallas, Dept Mat Sci & Engn, 800 West Campbell Rd, Richardson, TX 75080 USA
基金
美国国家科学基金会;
关键词
TRANSITION-METAL DICHALCOGENIDES; FIELD-EFFECT TRANSISTORS; TUNGSTEN DISELENIDE; PLASMA EXPOSURE; CONTACTS; NITRIDE; STRAIN; MOS2;
D O I
10.1063/1.5002132
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Covalent p-type doping of WSe2 thin films grown by molecular beam epitaxy and WSe2 exfoliated from bulk crystals is achieved via remote nitrogen plasma exposure. X-ray photoelectron and Raman spectroscopies indicate covalently bonded nitrogen in the WSe2 lattice as well as tunable nitrogen concentration with N-2 plasma exposure time. Furthermore, nitrogen incorporation induces compressive strain on the WSe2 lattice after N-2 plasma exposure. Finally, atomic force microscopy and scanning tunneling microscopy reveal that N-2 plasma treatment needs to be carefully tuned to avoid any unwanted strain or surface damage. (c) 2018 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license.
引用
收藏
页数:7
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