Current collapseless high-voltage GaN-HEMT and its 50-W boost converter operation

被引:20
作者
Saito, Wataru [1 ]
Kuraguchi, Masahiko
Takada, Yoshiharu
Tsuda, Kunio
Saito, Yasunobu [1 ]
Omura, Ichiro [1 ]
Yamaguchi, Masakazu [1 ]
机构
[1] Toshiba Co Ltd, Saiwai Ku, 1 Komukai Toshiba Cho, Kawasaki, Kanagawa 2128583, Japan
来源
2007 IEEE INTERNATIONAL ELECTRON DEVICES MEETING, VOLS 1 AND 2 | 2007年
关键词
D O I
10.1109/IEDM.2007.4419087
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Suppression of the on-resistance modulation caused by the current collapse phenomena in the high-voltage GaN-HEMT was successful by using dual-field plate (FP) structure and back-side FP, A 480-V/2A GaN-HEMT was designed and fabricated for power electronic applications. In this device, the on-resistance modulation was negligible as low as 5% even under an applied voltage of 300 V Boost converter circuit was demonstrated using the fabricated device with an output power of 54 W, high power efficiency of 92.7% and high switching frequency of 1 MHz.
引用
收藏
页码:869 / +
页数:2
相关论文
共 10 条
[1]  
Ando Y, 2005, INT EL DEVICES MEET, P585
[2]  
BOUNTROS KS, 2006, P ISPSD 06, P321
[3]  
DORA Y, 2005, P TECH DIG DRC, P191
[4]  
*ISE INT SYST ENG, 2002, ISE TCAD MAN 11
[5]  
Nomura T, 2006, INT SYM POW SEMICOND, P313
[6]   ALGaN/GaN moshfet integrated circuit power converter [J].
Pytel, SG ;
Lentijo, S ;
Koudymov, A ;
Rai, S ;
Fatima, H ;
Adivarahan, V ;
Chitnis, A ;
Yang, J ;
Hudgins, JL ;
Santi, E ;
Monti, A ;
Simin, G ;
Khan, MA .
PESC 04: 2004 IEEE 35TH ANNUAL POWER ELECTRONICS SPECIALISTS CONFERENCE, VOLS 1-6, CONFERENCE PROCEEDINGS, 2004, :579-584
[7]  
Saito W, 2005, INT EL DEVICES MEET, P597
[8]   Theoretical limit estimation of lateral wide band-gap semiconductor power-switching device [J].
Saito, W ;
Omura, I ;
Ogura, T ;
Ohashi, H .
SOLID-STATE ELECTRONICS, 2004, 48 (09) :1555-1562
[9]  
Ueda D, 2005, INT EL DEVICES MEET, P389
[10]  
UESUGI T, 2006, P CIPS 06, P163