High-speed Sampling System in CMOS

被引：0

作者：

Ulvestad, E. ^{[1
]}

Kjelgard, K. G. ^{[1
]}

Khanshan, T. Moradi ^{[1
]}

Wisland, D. T. ^{[1
]}

Lande, T. S. ^{[1
]}

机构：

[1] Univ Oslo, Dept Informat, Oslo, Norway

来源：

2018 IEEE NORDIC CIRCUITS AND SYSTEMS CONFERENCE (NORCAS): NORCHIP AND INTERNATIONAL SYMPOSIUM OF SYSTEM-ON-CHIP (SOC) | 2018年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper we will present a high-speed sampling system intended for use in a depth selective or depth resolved spectroscopic LIDAR for transcutanuous blood assessment. A continuous-time (CT) sampling solution enabling sampling rates close to 100 GHz, close to two orders of magnitude faster than standard clocked systems. Based on experimental verification in 90nm CMOS technology, opportunities and limitations of CT sampling systems are analyzed.

引用

页数：5

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