Mechanism for increasing dopant incorporation in semiconductors via doped nanostructures

被引:11
作者
Kuskovsky, Igor L. [1 ]
Gu, Y.
Gong, Y.
Yan, H. F.
Lau, J.
Noyan, I. C.
Neumark, G. F.
Maksimov, O.
Zhou, X.
Tamargo, M. C.
Volkov, V.
Zhu, Y.
Wang, L.
机构
[1] CUNY Queens Coll, Dept Phys, Flushing, NY 11367 USA
[2] Columbia Univ, Dept Appl Phys & Appl Math, New York, NY 10027 USA
[3] CUNY City Coll, Dept Chem, New York, NY 10036 USA
[4] Brookhaven Natl Lab, Div Mat Sci, Upton, NY 11973 USA
[5] Charles Evans & Assoc, Sunnyvale, CA 94086 USA
来源
PHYSICAL REVIEW B | 2006年 / 73卷 / 19期
关键词
D O I
10.1103/PhysRevB.73.195306
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A long-standing problem for ZnSe (and related alloys) has been to obtain good p-type doping. Recent work has given about an order-of-magnitude improvement in such doping by use of Te as a "codopant" to facilitate the introduction of an acceptor dopant (N), since it is known that p-ZnTe can be obtained quite readily; the Te was introduced in submonolayer quantities via planar (delta) doping during molecular beam epitaxy. Here, we examine the mechanism of this improved doping. We show that it resides in the formation of ZnTe-rich nanoislands, with the N embedded in these. This result is obtained by studies involving transmission electron microscopy, high-resolution x-ray diffraction, secondary-ion mass spectroscopy, and temperature quenching of photoluminescence. We note that these nanoislands appear quite unique, in providing doping of semiconductors, and thus are of great interest of their own.
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页数:5
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