Error Probability and SINR Analysis of Optimum Combining in Rician Fading

被引:138
作者
McKay, Matthew R. [1 ]
Zanella, Alberto [2 ]
Collings, Iain B. [3 ]
Chiani, Marco [2 ]
机构
[1] Hong Kong Univ Sci & Technol, Dept Elect & Comp Engn, Kowloon, Hong Kong, Peoples R China
[2] Univ Bologna, DEIS, CNR, IEIIT BO, Bologna, Italy
[3] CSIRO, ICT Ctr, Wireless Technol Lab, Epping, NSW 1710, Australia
关键词
Adaptive arrays; cochannel interference; optimum combining; Rician fading; CORRELATED RAYLEIGH INTERFERERS; MULTIPLE COCHANNEL INTERFERERS; M-ARY PSK; PERFORMANCE ANALYSIS; OUTAGE PROBABILITY; WISHART MATRICES; SIGNALS; NOISE; CHANNELS; SYSTEMS;
D O I
10.1109/TCOMM.2009.03.060521
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper considers the analysis of optimum combining systems in the presence of both co-channel interference and thermal noise. We address the cases where either the desired-user or the interferers undergo Rician fading. Exact expressions are derived for the moment generating function of the SINR which apply for arbitrary numbers of antennas and interferers. Based on these, we obtain expressions for the symbol error probability with M-PSK. For the case where the desired-user undergoes Rician fading, we also derive exact closed-form expressions for the moments of the SINR. We show that these moments are directly related to the corresponding moments of a Rayleigh system via a simple scaling parameter, which is investigated in detail. Numerical results are presented to validate the analysis and to examine the impact of Rician fading on performance.
引用
收藏
页码:676 / 687
页数:12
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