VERISEC: VERIfying Equivalence of SEquential Circuits using SAT

被引:3
|
作者
Syal, M [1 ]
Hsiao, MS [1 ]
机构
[1] Virginia Tech, Bradley Dept Elect & Comp Engn, Blacksburg, VA 24061 USA
来源
HLDVT'05: TENTH ANNUAL IEEE INTERNATIONAL HIGH-LEVEL DESIGN VALIDATION AND TEST WORKSHOP, PROCEEDINGS | 2005年
关键词
D O I
10.1109/HLDVT.2005.1568813
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
In this paper we propose a novel framework to verify equivalence of sequential circuits using Boolean Satisfiability (SAT). We tackle a problem that is harder than the traditional sequential hardware equivalence; specifically, we address the uninvestigated problem of verifiying delay replaceability [1] of two sequential designs. This notion of sequential equivalence does not make any assumptions either about the design-environment or about the design's steady state behavior. Thus, verifying delay replaceability is considered as hard as verifying safe replaceability [1] of sequential circuits (conjectured as EXPSPACE complete). Our SAT-based framework has the following salient features: (a) a methodology to inductively prove equivalence (delay replaceability) of sequential circuits with no assumptions about any initial state; (b) a scheme to include sequential logic implications into the framework; and (c) a low-cost scheme to identify equivalent flip-flop pairs on the fly. We used our tool to successfully verify several sequential benchmark circuits. Low execution times make our framework practical and scalable.
引用
收藏
页码:52 / 59
页数:8
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