High-precision X-ray diffractometer on the base of acoustic monochromator

被引：9

作者：

Mkrtchyan, A. R. ^{[1
,2
]}

Mkrtchyan, A. H. ^{[1
]}

Kocharyan, V. R. ^{[1
]}

Movsisyan, A. E. ^{[1
]}

Dabagov, S. B. ^{[3
]}

Potylicyn, A. P. ^{[2
]}

机构：

[1] NAS Armenia, Inst Appl Problems Phys, Yerevan, Armenia

[2] Tomsk State Engn Inst, Tomsk, Russia

[3] Frascatti Natl Lab INFN LNF, Natl Inst Nucl Phys, Frascati, Italy

来源：

JOURNAL OF CONTEMPORARY PHYSICS-ARMENIAN ACADEMY OF SCIENCES | 2013年 / 48卷 / 03期

关键词：

X-ray diffractometer; acoustic monochromator; CRYSTALS;

D O I：

10.3103/S1068337213030092

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

A new scheme for X-ray difractometer based on acoustic monochromator has been developed and created. The advantages of the new diffractometer are high-level of X-ray monochromaticity, high intensity of diffracted waves, high density of energy flow, and the absence of background.

引用

页码：141 / 143

页数：3

共 12 条

[1]

[Anonymous], P 5 NAT C APPL XRAY

[2] MODULATION OF GAMMA-RAYS AND X-RAYS BY ULTRASONIC VIBRATIONS IN CRYSTALS [J].

GABRIELYAN, RG ;

ASLANYAN, HA .

PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1984, 123 (02) :K97-K99

[3] Interference absorption coefficient of X-rays in crystals in the presence of temperature gradient [J].

Kocharyan, V. R. ;

Aleksanyan, R. Sh. ;

Truni, K. G. .

JOURNAL OF CONTEMPORARY PHYSICS-ARMENIAN ACADEMY OF SCIENCES, 2010, 45 (04) :190-194

[4]

Mkrtchyan A. H., 2005, Journal of Contemporary Physics, V40, P40

[5]

Mkrtchyan A.R., 2004, Patent of Armeina, Patent No. [P20030103, 20030103]

[6]

Mkrtchyan A.R., 1986, J CONTEMP PHYS-ARME, V21, P38

[7]

Mkrtchyan A.R., 1990, J CONTEMP PHYS-ARME, V25, P41

[8]

Mkrtchyan A.R., 2012, Patent of Armenia, Patent No. [AM20120152, 20120152]

[9]

Mkrtchyan A.R., 1986, J CONT PHYS ARMENIAN, V21, P56

[10]

MKRTCHYAN AR, 1982, PISMA ZH TEKH FIZ, V8, P677

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