A Highly Fault-Efficient SAT-Based ATPG Flow

被引：12
作者：
Eggersgluess, Stephan [1 ,2 ]
Drechsler, Rolf
机构：
[1] German Res Ctr Artificial Intelligence DFKI, D-28359 Bremen, Germany
[2] Univ Bremen, Inst Comp Sci, D-28359 Bremen, Germany
来源：
IEEE DESIGN & TEST OF COMPUTERS | 2012年 / 29卷 / 04期
关键词：
GENERATION; SATISFIABILITY; ACCELERATION;
D O I：
10.1109/MDT.2012.2205479
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：63 / 70
页数：8
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