Exponents of intrachain correlation for self-avoiding walks and knotted self-avoiding polygons

被引:6
|
作者
Uehara, Erica [1 ]
Deguchi, Tetsuo [1 ]
机构
[1] Ochanomizu Univ, Dept Phys, Grad Sch Human & Sci, Bunkyo Ku, Tokyo 1128610, Japan
关键词
POLYMER-CHAIN; INTERNAL DISTANCES; GOOD SOLVENT; CLICK; SHAPE; SIZE;
D O I
10.1088/1751-8113/46/34/345001
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We show numerically that critical exponents for two-point intrachain correlation of an infinite chain characterize those of finite chains in self-avoiding walk (SAW) and self-avoiding polygon (SAP) under a topological constraint. We evaluate short-distance exponents theta (i, j) through the probability distribution functions of the distance between the ith and jth vertices of N-step SAW (or SAP with a knot) for all pairs (1 <= i, j <= N). We construct the contour plot of theta (i, j), and express it as a function of i and j. We suggest that it has quite a simple structure. Here exponents theta (i, j) generalize des Cloizeaux's three critical exponents for short-distance intrachain correlation of SAW, and we show the crossover among them. We also evaluate the diffusion coefficient of knotted SAP for a few knot types, which can be calculated with the probability distribution functions of the distance between two nodes.
引用
收藏
页数:28
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