Magnetoresistance study in thin zig zag NiFe wires

被引:18
作者
Tsai, JL [1 ]
Lee, SF
Yao, YD
Yu, C
Liou, SH
机构
[1] Acad Sinica, Inst Phys, Taipei 115, Taiwan
[2] Univ Nebraska, Dept Phys, Lincoln, NE 68588 USA
关键词
D O I
10.1063/1.1453318
中图分类号
O59 [应用物理学];
学科分类号
摘要
Thickness dependence on the domain wall resistivity of zig zag thin permalloy wires was studied from 10 to 300 K. The maximum domain wall resistivity was obtained in wire with 100-nm-film thickness. The multidomain state resistivity was 14.29 muOmega cm, while single-domain state resistivity was 14.36 muOmega cm at 10 K. The ratio of domain wall magnetoresistance was measured to be 0.034%, 0.112%, and 0.258%, and the magnetic field where the domain wall started to switch was measured as -70, -40, and +80 Oe for wires with thicknesses of 20, 40, and 100 nm, respectively, at 250 K. Domain wall resistivity was nearly independent of temperature for wire with 40-nm-film thickness but varied significantly with temperature for 100-nm-thick wire between 10 and 300 K. (C) 2002 American Institute of Physics.
引用
收藏
页码:7983 / 7985
页数:3
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