Amorphous Silicon Thin-Film Transistors made on Clear Plastic at 300°C

被引:2
作者
Cherenack, Kunigunde H. [1 ]
Kattamis, Alex Z.
Hekmashoar, Bahman
Sturm, James C.
Wagner, Sigurd
机构
[1] Princeton Univ, Dept Elect Engn, Princeton, NJ 08544 USA
关键词
a-Si:H Thin Film Transistors; Polymer Substrates; Strain Control; Self-alignment; TFTS; TEMPERATURE; STABILITY; SUBSTRATE; ARRAYS; GLASS;
D O I
10.3938/jkps.54.415
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We have made a-Si:H TFTs at a process temperature of 300 degrees C on free-standing clear plastic foil substrates and have improved the large-area alignment of TFT device layers. The key to achieving flat and crack-free samples is to design the mechanical stresses in the substrate passivation and transistor layers, allowing it to obtain functional transistors over the entire active surface. The TFT gate and the back-channel passivation were self-aligned. Back-channel passivated TFTs made at 300 degrees C on glass substrates and plastic substrate have identical electrical characteristics and gate bias stress stability. These results suggest that free-standing clear plastic foil can replace display glass as a substrate from the points of process temperature, substrate and device integrity and TFT performance and stability.
引用
收藏
页码:415 / 420
页数:6
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