TEM analyses of synthetic anti-ferromagnetic (SAF) nanoparticles fabricated using different release layers

被引:5
作者
Koh, Ai Leen [1 ,2 ]
Hu, Wei [1 ]
Wilson, Robert John [1 ]
Wang, Shan Xiang [1 ,3 ]
Sinclair, Robert [1 ]
机构
[1] Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USA
[2] Stanford Univ, Dept Mech Engn, Stanford, CA 94305 USA
[3] Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USA
关键词
Transmission electron microscopy; Magnetic nanoparticles; Magnetic thin films;
D O I
10.1016/j.ultramic.2008.03.012
中图分类号
TH742 [显微镜];
学科分类号
摘要
This paper investigates the structural characteristics of templated synthetic anti-ferromagnetic (SAF) magnetic nanoparticles fabricated on two different release layers. When copper was used as the latter, the layered structure of the SAFs was found to be disrupted with wavy multi-layers due to the formation of copper grains from the release layer. By introducing oxygen into the copper release layer before the deposition of the film, the topography of the oxidized copper grains was effectively controlled. This led to the fabrication of SAF nanoparticles with flat multi-layers. (C) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码:1490 / 1494
页数:5
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