Measurement of young's modulus and stress analysis of a magnetic thin film

被引：0

作者：

Yanai, H ^{[1
]}

Kishine, N ^{[1
]}

Komaba, Y ^{[1
]}

Murakami, Y ^{[1
]}

机构：

[1] KYUSHU UNIV,FAC MECH ENGN,HIGASHI KU,FUKUOKA 812,JAPAN

来源：

JSME INTERNATIONAL JOURNAL SERIES A-MECHANICS AND MATERIAL ENGINEERING | 1996年 / 39卷 / 01期

关键词：

flexible magnetic medium; Young's modulus; thin film; stress analysis; finite-element method;

D O I：

10.1299/jsmea1993.39.1_129

中图分类号：

TH [机械、仪表工业];

学科分类号：

0802 ;

摘要：

In order to evaluate the mechanical properties of a very thin film, this paper proposes a convenient method for separately determining Young's moduli of two thin films of a magnetic recording medium. Furthermore, the particular stress distribution inside a magnetic recording film (two bonded thin films) is analyzed. The internal stress in the medium is not uniform when the medium is subjected to unidirectional tension. The analysis shows that the difference in Poisson's ratio on two thin films causes flexure of the two bonded films under tension, as well as shearing stress at the interface between the magnetic layer and the substrate. Since the shearing stress may cause fatigue damage of the tape edge, detailed FEM analysis on its distribution is carried out.

引用

页码：129 / 134

页数：6