Electrical Detection of Quantum Dot Hot Electrons Generated via a Mn2+-Enhanced Auger Process

被引:21
作者
Barrows, Charles J. [1 ]
Rinehart, Jeffrey D. [2 ]
Nagaoka, Hirokazu [3 ]
deQuilettes, Dane W. [1 ]
Salvador, Michael [4 ]
Chen, Jennifer I. L. [5 ]
Ginger, David S. [1 ]
Gamelin, Daniel R. [1 ]
机构
[1] Univ Washington, Dept Chem, Seattle, WA 98195 USA
[2] Univ Calif San Diego, Dept Chem & Biol Chem, San Diego, CA 92103 USA
[3] JNC Petrochemical Corp, Ichihara Res Ctr, Chiba, Japan
[4] Friedrich Alexander Univ Erlangen Nurnberg, Dept Mat Sci & Engn, Erlangen, Germany
[5] York Univ, Dept Chem, Toronto, ON, Canada
来源
JOURNAL OF PHYSICAL CHEMISTRY LETTERS | 2017年 / 8卷 / 01期
基金
美国国家科学基金会;
关键词
DOPED SEMICONDUCTOR NANOCRYSTALS; INJECTION; PHOTOLUMINESCENCE; PHOTODETECTION; RELAXATION; INTENSITY; EMISSION; DYNAMICS; CELLS; FILMS;
D O I
10.1021/acs.jpclett.6b02219
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
An all-solid-state quantum-dot-based photon-to-current conversion device is demonstrated that selectively detects the generation of hot electrons. Photoexcitation of Mn2+-doped CdS quantum dots embedded in the device is followed by efficient picosecond energy transfer to Mn2+ with a long-lived (millisecond) excited-state lifetime. Electrons injected into the QDs under applied bias then capture this energy via Auger de excitation, generating hot electrons that possess sufficient energy to escape over a ZnS blocking layer, thereby producing current. This electrically detected hot-electron generation is correlated with a quench in the steady-state Mn2+ luminescence and the introduction of a new nonradiative excited-state decay process, consistent with electron-dopant Auger cross-relaxation. The device's efficiency at detecting hot-electron generation provides a model platform for the study of hot-electron ionization relevant to the development of novel photodetectors and alternative energy-conversion devices.
引用
收藏
页码:126 / 130
页数:5
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