Accuracy Enhancement of Material Characterization in Sub-THz Range

被引：0
|
作者：
Piasecki, Przemyslaw [1 ]
Godziszewski, Konrad [1 ]
Yashchyshyn, Yevhen [1 ]
机构：
[1] Warsaw Univ Technol, Inst Radioelect, Warsaw, Poland
来源：
2014 20TH INTERNATIONAL CONFERENCE ON MICROWAVES, RADAR, AND WIRELESS COMMUNICATION (MIKON) | 2014年
关键词：
Sub-THz; measurement accuracy; permittivity;
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
In this paper many aspects of material characterization in sub-THz frequency range are shown. Methods of reducing unwanted reflections from construction of the measurement setup and from the sample under test are proposed. The influence of lens tilt on electromagnetic field distribution in location of the sample is investigated.
引用
收藏
页数：4
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