Aberration-free imaging for light and electrons

被引：3
作者：
Fluegel, B. [1 ]
Mascarenhas, A. [1 ]
机构：
[1] Natl Renewable Energy Lab, Golden, CO 80401 USA
来源：
APPLIED PHYSICS LETTERS | 2008年 / 93卷 / 16期
关键词：
D O I：
10.1063/1.3005582
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The equations for refraction of either the extraordinary wave of light or the wavefunction of an electron at a planar boundary between two misoriented uniaxially anisotropic materials are shown via raytracing to yield a transverse displacement of the object point. The displacement is independent of ray incidence angle and is thus free from spherical aberration, yielding a perfect virtual image which can have applications in birefringent optics. The general conditions for this aberration-free imaging are found to be identical to those required for amphoteric total refraction. (C) 2008 American Institute of Physics. [DOI: 10.1063/1.3005582]
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页数：3
相关论文
共 11 条
[1]  
Barsukov K. A., 1984, Optics and Spectroscopy, V56, P319
[2]   BALLISTIC ELECTRON-TRANSPORT IN SEMICONDUCTOR HETEROSTRUCTURES AND ITS ANALOGIES IN ELECTROMAGNETIC PROPAGATION IN GENERAL DIELECTRICS [J].
HENDERSON, GN ;
GAYLORD, TK ;
GLYTSIS, EN .
PROCEEDINGS OF THE IEEE, 1991, 79 (11) :1643-1659
[3]  
HOPF FA, 1985, APPL CLASSICAL ELECT, V1, P105
[4]   Negative refraction and omnidirectional total transmission at a planar interface associated with a uniaxial medium [J].
Liu, Z ;
Lin, ZF ;
Chui, ST .
PHYSICAL REVIEW B, 2004, 69 (11)
[5]   Near-field lenses in two dimensions [J].
Pendry, JB ;
Ramakrishna, SA .
JOURNAL OF PHYSICS-CONDENSED MATTER, 2002, 14 (36) :8463-8479
[6]   Negative refraction makes a perfect lens [J].
Pendry, JB .
PHYSICAL REVIEW LETTERS, 2000, 85 (18) :3966-3969
[7]   Criterion for negative refraction with low optical losses from a fundamental principle of causality [J].
Stockman, Mark I. .
PHYSICAL REVIEW LETTERS, 2007, 98 (17)
[8]  
Veselago VJUFN., 1967, Usp. Fiz. Nauk, V92, P517, DOI [10.3367/UFNr.0092.196707d.0517, DOI 10.3367/UFNR.0092.196707D.0517]
[9]   Reflection and refraction of light at the interface of a uniaxial bicrystal [J].
Wang, Y ;
Zha, XJ ;
Yan, JK .
EUROPHYSICS LETTERS, 2005, 72 (05) :830-836
[10]  
Zhang Y, 2007, SPRINGER SER MATER S, V98, P1, DOI 10.3115/1626281.1626282
12