Analysis of complex heterogeneous surfaces by bias-dependent scanning tunneling microscopy and spectroscopy

被引：0
|
作者：
Goldfarb, I [1 ]
Briggs, GAD
机构：
[1] Tel Aviv Univ, Dept Solid Mech Mat & Syst, Fleischman Fac Engn, IL-69978 Tel Aviv, Israel
[2] Univ Oxford, Dept Mat, Oxford OX1 3PH, England
来源：
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 2002年 / 91卷
关键词：
epitaxy; surface morphology; scanning tunneling microscopy; silicides; cobalt; germanium;
D O I：
10.1016/S0921-5107(01)00956-4
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
In this work we present analysis of various multicomponent surfaces, such as Si-Ge, Co-Ge and Co-Si, by combined bias-deperident scanning tunneling microscopy (STM) and spectroscopy (STS). Using the STM's capability for surface visualization with sub-nanometer resolution, and STS's capability to provide information directly linked to the surface density of states of these sub-nanometer regions, we were able to distinguish between such dissimilar nano-regions, some of which could only be revealed by bias-dependent STM imaging. The work emphasizes the need for a wider theoretical support in interpreting tunneling images and spectra. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：115 / 119
页数：5
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